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Electron microscope observations of stacking faults and microtwins in synthetic diamond
Philosophical Magazine 23 (182):473-484 (1971)
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References found in this work
Electron diffraction from crystals containing stacking faults: I.M. J. Whelan & P. B. Hirsch - 1957 - Philosophical Magazine 2 (21):1121-1142.
Absorption parameters in electron diffraction theory.C. J. Humphreys & P. B. Hirsch - 1968 - Philosophical Magazine 18 (151):115-122.
Electron diffraction from crystals containing stacking faults: II.M. J. Whelan & P. B. Hirsch - 1957 - Philosophical Magazine 2 (23):1303-1324.
Electron microscopy and diffraction of twinned structures in evaporated films of gold.D. W. Pashley & M. J. Stowell - 1963 - Philosophical Magazine 8 (94):1605-1632.
Diffraction contrast analysis of two-dimensional defects present in silicon after annealing.G. R. Booker & W. J. Tunstall - 1966 - Philosophical Magazine 13 (121):71-83.
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