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The contrast from interfaces in the field-ion microscope
Philosophical Magazine 25 (4):879-896 (1972)
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Citations of this work
Study of interfaces by field-ion microscopy.D. A. Smith - 1973 - Philosophical Magazine 27 (5):1169-1173.
References found in this work
Quantitative observation of misfit dislocation arrays in low and high angle twist grain boundaries.T. Schober & R. W. Balluffi - 1970 - Philosophical Magazine 21 (169):109-123.
Contrast from stacking faults and partial dislocations in the field-ion microscope.D. A. Smith, M. A. Fortes, A. Kelly & B. Ralph - 1968 - Philosophical Magazine 17 (149):1065-1077.
The interpretation of field-ion micrographs: Contrast from perfect dislocation loops.M. A. Fortes, D. A. Smith & B. Ralph - 1968 - Philosophical Magazine 17 (145):169-176.
Grain boundary topography in tungsten.H. F. Ryan & J. Suiter - 1964 - Philosophical Magazine 10 (106):727-729.
Inelastic changes in specimens during operation of the field-ion microscope.B. Loberg - 1971 - Philosophical Magazine 24 (189):593-602.
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